Synopsis

CTL_STATUS_t ctl_memchk_mats_plus_test_8b(void *start,
                                          size_t byte_count);

Description

ctl_memchk_mats_plus_test_8b runs a MATS+ test over the memory pointed to by start of byte_count bytes.

The marching steps are:

↕(w0); ↑(r0,w1); ↓(r1,w0)

Return Value

ctl_memchk_mats_plus_test_8b returns a standard status code.

References

8. R. Nair et al., "Efficient Algorithms for Testing Semiconductor Random Access Memories," lEEE Trans. Computers, Vol. C-28, No. 3, 1978.